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1

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Charged Particle Optics IV - Fast parallel acquisition electron energy analyzer

Walker, Christopher G. H., Walker, Andrew, Badheka, Ranjan, Kumashiro, Sumio, Jacka, Marcus, El Gomati, Mohamed, Prutton, Martin, Read, Frank H., Munro, Eric

Year:

1999

Language:

english

File:

PDF, 452 KB

english, 1999

2

Scanning Auger Electron Microscopy || Concluding Remarks

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 149 KB

english, 2005

3

Scanning Auger Electron Microscopy || Quantification of Auger Images

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 213 KB

english, 2005

4

Scanning Auger Electron Microscopy ||

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 52.32 MB

english, 2005

5

Scanning Auger Electron Microscopy || Forming an Auger Image

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 5.73 MB

english, 2005

6

Scanning Auger Electron Microscopy || Front Matter

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 170 KB

english, 2005

7

Scanning Auger Electron Microscopy || Author Index

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 127 KB

english, 2005

8

Scanning Auger Electron Microscopy || Subject Index

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

Language:

english

File:

PDF, 153 KB

english, 2005

9

Scanning Auger Electron Microscopy || Introduction

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 408 KB

2005

10

Scanning Auger Electron Microscopy || The Auger Process

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 1.28 MB

2005

11

Nondestructive Angle-resolved X-ray Depth Profiling: Interpretation of Angle-resolved Profiles Using a Monte Carlo Approach

Wilkinson, David K., Loveday, Daniel A., Prutton, Martin

Journal:

Microscopy and Microanalysis

Year:

2000

Language:

english

File:

PDF, 1.85 MB

english, 2000

12

Scanning Auger Electron Microscopy || Instrumentation

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 15.63 MB

2005

13

Scanning Auger Electron Microscopy || The Spatial Resolution

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 4.04 MB

2005

14

Scanning Auger Electron Microscopy || Image Processing and Interpretation

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 6.43 MB

2005

15

From LEED to MULSAM

Journal:

Surface and Interface Analysis

Year:

2000

Language:

english

File:

PDF, 446 KB

english, 2000

16

Scanning Auger Electron Microscopy || Applications: Materials Science

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 10.96 MB

2005

17

Scanning Auger Electron Microscopy || Applications: Semiconductor Manufacturing

Prutton, Martin, El Gomati, Mohamed M.

Year:

2005

File:

PDF, 7.40 MB

2005

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